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WebSIC KGD Tester PB6200&PT620. Semight Instruments PB6200&PT6200 KGD testing system can be mainly used for power chip Die-level dynamic and static test to implement … WebGood Die (KGD) test for an individual IC prior to bonding may be more cost-effective than relying solely on stack tests to identify a defective die that has already rendered the entire system defective. In the second scenario of Figure 3, a stack test is performed each time a KGD is bonded to the top of the IC stack to screen ... tempus holdings 91 scsp
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